Services
Extended analysis
VDA 19.1:2015 – ISO 16232: 2018
At BIDEA LAB we can perform analysis on individual particles, scan the entire filter, perform correlative SEM/EDX tests as well as FT-IR analysis for organic particles. Extended analysis are used to determine the nature of the contaminating particle avoiding false positives or negatives resulting from a standard metallic shiny/non-shiny classification. Extended cleanliness inspections are very useful for decision making and continuous improvement.
SEM EDX analysis (inorganic particles)
A SEM/EDX analysis is a combined method for counting and measuring particles (in the scanning electron microscope SEM) and performing elemental determination of the particle nature (by X-ray microscopy EDX). This type of analysis provides information about the unambiguous nature of inorganic particles: conductive, non-conductive, abrasive, non-abrasive, etc….
FT-IR analysis (organic particles)
This type of analysis allows organic particle identification. The IR spectra measured with this method are compared with spectra of typical materials using libraries. In addition, the measured IR spectrum can also be compared with the IR spectrum of the suspected reference material. This allows conclusions to be drawn about the origin of organic impurities, such as plastic particles from molding burrs, impurities from packaging (plastic, cardboard, wood), and also textile fibers for example.
Application and Purpose:
- Inorganic and organic particles.
- Determination of the unambiguous nature of the material: conductive, non-conductive, abrasive, non-abrasive particles, fibers, polymers etc…
- Commonly used to investigate a potential cause of damage and also in the field of continuous improvement and decision making.
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